CAS: 4430-09-5; N,N-Dihexylaniline

该化合物是一种有机化合物,被归类为芳香矿;它具有一种附于阴性结构氮原子的六氟基化合物,这助长了其疏水特性;该化合物一般是无色的,可粉色黄色液体,具有典型的探明味;该化合物在水中溶解性相对较低,但在有机溶剂中可溶解,但可溶于有机溶剂,使之在各种应用中有用,包括作为染料,色素和药物合成的中间体;六氟基化合物的存在会增加其脂性,从而影响其在生物系统和环境环境中的行为;N,N-Dihexylaniline还可能表现出中度毒性,在使用过程中需要小心处理和采取适当的安全措施;其化学稳定性和再活性可视环境条件而不同,例如温度和pH.

结构式图片

欧盟法规

ECHA物质C&L通报

上下游产品

CAS号638-45-9 1-碘己烷 | CAS号111-25-1 1-溴代正己烷 | CAS号2305-21-7 反式-2-已烯-1-醇 | CAS号143-16-8 二已胺 | CAS号108-90-7 氯苯 | CAS号4746-32-1 N-己基苯胺 | CAS号111-27-3 正己醇 | CAS号90133-80-5 4-(dihexylamino... | CAS号90134-09-1 N,N-dihexyl-4-i...

合成工艺路线路线简述

  • 合成目标产物 N N-Di-N-Hexylaniline 97 主要起始原料 P-Toluenesulfonic Acid N-Hexyl Ester And Aniline
  • (文献来源)合成步骤主要原料 P-Toluenesulfonic Acid N-Hexyl Ester 和 Aniline
📜苯胺 反应生成 N,N-Di-N-己基苯胺
参考文献:制备一些n-烷基-和nn-二烷基-对亚硝基苯胺
标题:制备一些n-烷基-和nn-二烷基-对亚硝基苯胺
摘要:
DOI:10.1039/jr9550001677

海关参考信息

专利信息


专利号:US-8053161-B2
优先权日:2006-09-25
标 题 :Resist composition, resin for use in the resist composition, compound for use in the synthesis of the resin, and pattern-forming method using the resist composition
发明人:WADA KENJI; SAEGUSA HIROSHI
权利人:FUJIFILM CORP
摘要:A resist composition comprises: (A) a resin capable of increasing its solubility in an alkali developer by action of an acid; (B) a compound capable of generating an acid upon irradiation with actinic ray or radiation; (C) a resin having at least one of a fluorine atom and a silicon atom; and (D) a solvent, wherein the resin (C) has a degree of molecular weight dispersion of 1.3 or less and a weight average molecular weight of 1.0×10 4 or less.

专利号:US-9709891-B2
优先权日:2005-12-09
标 题:Positive resist composition, resin used for the positive resist composition, compound used for synthesis of the resin and pattern forming method using the positive resist composition
发明人:KANDA HIROMI; KANNA SHINICHI
权利人:FUJIFILM CORP
摘要:A positive resist composition comprises: (A) a resin of which solubility in an alkali developer increases under an action of an acid; (B) a compound capable of generating an acid upon irradiation with actinic rays or radiation; (C) a resin having at least one of a fluorine atom and a silicon atom; and (D) a solvent; and a pattern forming method using the positive resist composition.

专利号:US-8679724-B2
优先权日:2005-12-09
标题 :Positive resist composition, resin used for the positive resist composition, compound used for synthesis of the resin and pattern forming method using the positive resist composition

专利号:US-2008081290-A1
优先权日:2006-09-25
标 题 :Resist composition, resin for use in the resist composition, compound for use in the synthesis of the resin, and pattern-forming method using the resist composition

专利号:US-2007134588-A1
优先权日:2005-12-09
标 题:Positive resist composition, resin used for the positive resist composition, compound used for synthesis of the resin and pattern forming method using the positive resist composition

专利号:US-2014134541-A1
优先权日:2005-12-09
标题 :Positive resist composition, resin used for the positive resist composition, compound used for synthesis of the resin and pattern forming method using the positive resist composition

供应商参考报价(招募中)

品牌试剂参考报价(招募中)

📌 第三方产品分析报告

✅ COA系统入驻 | 共享模式

合成参考文献


参考文献:10.1007/bf02672546
摘要:Cowan JC. Dimer Acids. J Americ Oil Chem Soc. 1962 Dec;39(12):534–45. doi: 10.1007/bf02672546.
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