参考文献:10.1107/s2052520620002917 摘要:Jha KK, Gruza B, Kumar P, Chodkiewicz ML, Dominiak PM. TAAM: a reliable and user friendly tool for hydrogen-atom location using routine X-ray diffraction data. Acta Crystallogr B Struct Sci Cryst Eng Mater. 2020 Jun 01;76(Pt 3):296–306. doi: 10.1107/s2052520620002917.